English Our project focuses on testing MOSFET transistors in reverse bias, measuring the leakage current. Up to 45 transistors are simultaneously tested in a single run. Our main task is to measure these leakage currents and graphically represent them. To achieve this, we designed a customized circuit board capable of processing these currents. The collection and encoding of the measured data were another key aspect of our work. The encoded data is sent to an external ESP32, which transfers the values via the COM port of a PC. A specially developed program on the PC captures the transmitted measurement data and forwards it to a database. The database plays a crucial role by storing the collected information. When needed, the stored values can be retrieved and displayed from the database. The entire system thus provides an efficient and precise method for monitoring and analyzing MOSFET transistors in reverse bias.

Our project is being edited and created at the HTL Mössingerstraße

This project is being carried out together with a business partner:

Deutsch Unser Projekt konzentriert sich auf den Test von MOSFET-Transistoren in Sperrrichtung, wobei der Leckstrom gemessen wird. Bis zu 45 Transistoren werden gleichzeitig in einem Testdurchlauf geprüft. Unsere Hauptaufgabe besteht darin, diese Leckströme zu messen und sie grafisch darzustellen. Um dies zu realisieren, haben wir eine maßgeschneiderte Platine entworfen, die in der Lage ist, diese Ströme zu verarbeiten. Die Erfassung und Codierung der gemessenen Daten war ein weiterer Schlüsselaspekt unserer Arbeit. Die codierten Daten werden an einen externen ESP32 gesendet, der die Werte über das COM-Board eines PCs überträgt. Ein eigens entwickeltes Programm auf dem PC erfasst die übertragenen Messdaten und leitet sie an eine Datenbank weiter. Die Datenbank spielt eine entscheidende Rolle, indem sie die gesammelten Informationen speichert. Bei Bedarf können die gespeicherten Werte von der Datenbank abgerufen und angezeigt werden. Das gesamte System bietet somit eine effiziente und präzise Methode zur Überwachung und Analyse von MOSFET-Transistoren in Sperrrichtung.

Details

Hardware

Control-Board

The control board is designed to capture all leakage currents of the 45 devices under test (DUTs). The voltage drop across shunts is measured in the process. All voltages are then combined onto an output line through multiplexers. This output line leads to an amplifier. This amplifier processes the voltage in such a way that the possible range of voltages always remains within the range of the ADC (Analog-to-Digital Converter). The internal ADC of the ESP32 digitizes the analog values. Using these values, the leakage current is then calculated back using Ohm's Law.

trending_up Software

MOSFET-RCM APP

The measurement data captured by the hardware is first encoded in the ESP32. This encoding includes the leakage current, the channels of the respective multiplexers, the number of the measurement board, the type of measurement, and the timestamp of the measurement. This encoded string is then sent via ESPNow to another device known as the Master ESP. The Master ESP, in turn, outputs this string through the COM port of a PC. Our self-programmed software decodes this string and uploads the received data to a database. To display the data for individual or multiple Devices Under Test (DUTs), all the required values are downloaded from the database and presented.